Spectral Metrology/Laser Photometry

Spectral Metrology/Laser Photometry

REO maintains an extensive set of lasers for metrology, covering more than 30 wavelengths and bands between 244nm and 10.6um. A range of standard and proprietary measurement techniques allows us to characterize reflectivity, transmission, polarization extinction, retardance and other functional characteristics across all angles of incidence.

Spectrophotometers, both dual-beam and FTIR, cover a wavelength range from 180nm to 20um, with a large number of fixtures to accommodate various sizes and geometries over the full range of incident angles.

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Contact REO to have us start thinking about you. 303.938.1960

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