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Adaptive characterization of laser damage from sparse defects (SPIE)

This paper explores the new REO adaptive strategy that increases efficiency and minimizes uncertainty by adding defect identification into laser-induced damage testing.

Standard techniques for characterizing laser damage are ill-suited to the regime in which sparse defects form the dominant damage mechanism. Previous work on this problem using REO’s automated laser damage threshold test system has included linking damage events in HfO2/SiO2 high reflector coatings with visible pre-existing defects, and using a probability per defect based on size and local fluence to generate predictions of damage events in subsequent coating runs. However, in all this work the test sites were always in a predefined array, and the association of defects with damage events was done only after the fact. In an effort to make this process both more efficient and less susceptible to uncertainties, we have now developed an adaptive test strategy that puts defect identification and analysis into the loop. A map of defect locations and sizes on a test surface is compiled, and a set of test sites and corresponding fluences based on that map is then generated. With defects of interest now centered on the damaging beam, the problem of higher-order spatial variation in the beam profile is greatly reduced. Test sites in zones with no detectable defects are also included. This technique allows for the test regimen to be tailored to the specific surface under consideration. We report on characterization of a variety of coating materials and designs with this adaptive method.

This paper was originally published by the SPIE at Laser Damage 2014: 

Sam Richman ; Alexander R. Martin ; Quentin Turchette and Trey Turner, " Adaptive characterization of laser damage from sparse defects ", Laser-Induced Damage in Optical Materials: 2014, edited by Gregory J. Exarhos; Vitaly E. Gruzdev; Joseph A. Menapace; Detlev Ristau; MJ Soileau, Proceedings of SPIE Vol. 9237 (SPIE, Bellingham, WA, 2014) 

Copyright 2014 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited. © (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE).




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